发明名称 MULTILAYER ELECTRIC PROBE AND MANUFACTURING METHOD THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a multilayer electric probe having the capability of enduring high current and the desired mechanical strength and its manufacturing method. <P>SOLUTION: The multilayer electric probe, suitable for testing a device to be tested, includes a first strip layer and a second strip layer. The first strip layer has a first conductivity and a first mechanical strength. The second strip layer has a second conductivity and a second mechanical strength. The first strip layer and the second strip layer are adhered solidly, together as a structural body so as to produce at least either the desired capabilities of withstanding the current or the mechanical strength. The multilayer electric probe may further include at least a third strip layer, having the capability of enduring current and the desired mechanical strength. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008107313(A) 申请公布日期 2008.05.08
申请号 JP20070064785 申请日期 2007.03.14
申请人 IND TECHNOL RES INST 发明人 HUANG MENG-CHI;SHU BINKETSU;CHANG FUH-YU;WU CHING-PING
分类号 G01R1/067 主分类号 G01R1/067
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