SEMICONDUCTOR DEVICE TEST HANDLER

摘要

A semiconductor device test handler is provided to improve reliability of a test result by maintaining the temperature condition demanded for a test of a semiconductor device for the sufficient time. In a semiconductor device test handler, a device loading unit(100) has a loading chamber(110) for receiving a tray loading semiconductor devices and keeping the semiconductor devices loaded in the tray, at a test temperature by a temperature controller. A device test unit(200) includes a test module(210) for receiving the semiconductor device from the loading chamber and testing the semiconductor device. A device sorting unit(300) classifies the semiconductor devices according to the test result of the device test unit and receives the semiconductor devices from the device test unit.