发明名称 MANUFACTURING METHOD FOR THIN FILM TRANSISTOR, ELECTRO-OPTIC DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film transistor by which interface level density between a silicon layer and a gate insulating film can be lowered. SOLUTION: This method for manufacturing the thin film transistor includes the steps of: forming the silicon layer 4 on a substrate 2; forming a silicon oxide film 5a on the silicon layer 4 by a chemical vapor deposition method using a tetraethoxysilane as a raw material gas; forming a silicon nitride film 5b at an upper layer of the silicon oxide film 5a; and executing an annealing treatment. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008109077(A) 申请公布日期 2008.05.08
申请号 JP20070124504 申请日期 2007.05.09
申请人 SEIKO EPSON CORP 发明人 ABE DAISUKE
分类号 H01L21/336;G09F9/00;G09F9/30;H01L21/316;H01L21/318;H01L29/786 主分类号 H01L21/336
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