发明名称 |
MANUFACTURING METHOD FOR THIN FILM TRANSISTOR, ELECTRO-OPTIC DEVICE, AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film transistor by which interface level density between a silicon layer and a gate insulating film can be lowered. SOLUTION: This method for manufacturing the thin film transistor includes the steps of: forming the silicon layer 4 on a substrate 2; forming a silicon oxide film 5a on the silicon layer 4 by a chemical vapor deposition method using a tetraethoxysilane as a raw material gas; forming a silicon nitride film 5b at an upper layer of the silicon oxide film 5a; and executing an annealing treatment. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008109077(A) |
申请公布日期 |
2008.05.08 |
申请号 |
JP20070124504 |
申请日期 |
2007.05.09 |
申请人 |
SEIKO EPSON CORP |
发明人 |
ABE DAISUKE |
分类号 |
H01L21/336;G09F9/00;G09F9/30;H01L21/316;H01L21/318;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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