发明名称 MODEL PREPARING DEVICE, PROCESS ABNORMALITY ANALYZING DEVICE, METHOD AND PROGRAM OF THEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a model preparing device capable of setting suitable process step intervals and being used for the prediction of quality of an object. <P>SOLUTION: A model preparing device 10 inputs process data that are the information acquired in a time series during a period in which a process is carried out and related to the state of the process and inspection results information about an object processed by the process, and prepares a process-quality model representing the relationship between a process feature value that is extracted from the process-state information and the inspection results information. A step matching section 10a determines the interval of the process step for each process data of individual processes. A feature-value extracting section 10b extracts the process feature value for each unit object and each determined process step. An analyzing section 10e prepares a process-quality model by using the process feature value and the inspection results information that are matched because the related unit objects are common and executing analysis by data mining or the like. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008109101(A) 申请公布日期 2008.05.08
申请号 JP20070235193 申请日期 2007.09.11
申请人 OMRON CORP 发明人 OBAYASHI SHIGERU;HAGIWARA KENICHIRO;AIKAWA TEIICHI
分类号 H01L21/02;G05B19/418;G05B23/02;G06F19/00 主分类号 H01L21/02
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