ELECTRICAL IMPEDANCE TOMOGRAPHY METHOD AND DEVICE

摘要

The invention relates to an electrical impedance tomography method comprising: an electrical measurement step in which pre-determined electrical conditions are imposed on the surface (3) of a medium to be imaged, generating a mechanical disturbance at pre-defined points of the medium in order to alter the impedance of the medium locally and an electrical parameter is measured at several points (7) on the surface of the medium; and a calculation step in which the electrical impedance is determined at several points in the inside volume (2) of the medium, taking account of the measurements taken during the disturbance, as a function of a principle governing the modification of the electrical impedance by the aforementioned disturbance.