发明名称 Apparatus and method for a combination of a protocol test and a bit error measurement
摘要 <p>The protocol tester (42) has an input (46) for feeding data. A protocol decoding device (50) decodes the data and an output provides the decoded data. A measurement device (52) is provided for the measurement of the bit error rate. A protocol stack with a set of protocol layers, where one of the protocol layers is coupled with the input for feeding data. The protocol decoding device and the measurement device are coupled with the protocol layer of the protocol stack. A triggering device (56) activates an action concerning the protocol decoding device. An independent claim is also included for a method for performing a protocol test.</p>
申请公布号 EP1919130(A1) 申请公布日期 2008.05.07
申请号 EP20060023053 申请日期 2006.11.06
申请人 TEKTRONIX INTERNATIONAL SALES GMBH 发明人 FORSBACH, JUERGEN
分类号 H04L12/26 主分类号 H04L12/26
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