| 摘要 |
A sequential semiconductor test apparatus is provided to improve a test efficiency by selecting one of an implementation test and an ATE test according to a test selection command. A sequential semiconductor test apparatus includes a test pattern generating module(200) and at least two testing modules(300a,300b). The test pattern generating module generates test pattern data based on the data which is selected from an implementation test pattern and a test pattern program. Each of the testing modules receives the test pattern data from one of the test pattern generating modules, performs a test on a DUT(Device Under Test), and generates test result data on the DUT. The test pattern generating module includes an implementation test pattern data storage(210), an ATE(Automatic Test Equipment) test pattern data generator(220), a test pattern data selector(230), and a test pattern generating module communication interface(290).
|
