发明名称 Total internal reflection fluorescence microscope
摘要 A total internal reflection fluorescence microscope includes a light source which generates laser light having a plurality of wavelengths, a focal optical system which irradiates the laser light from the light source on a specimen at a predetermined incident angle via an objective lens and which generates evanescent illumination, a fluorescence observation unit which observes fluorescence generated from the specimen due to the evanescent illumination, an incident angle adjuster which adjusts the incident angle of the laser light irradiated on the specimen, and a controller which controls the incident angle adjuster such that the amount of the permeation depth of the evanescent light is the same when the wavelength of the laser light from the laser light source is switched.
申请公布号 US7369308(B2) 申请公布日期 2008.05.06
申请号 US20050050883 申请日期 2005.02.04
申请人 OLYMPUS CORPORATION 发明人 TSURUTA HIROSHI;SASAKI HIROSHI;KUSAKA KENICHI;ARAYA AKINORI;NAKATA TATSUO
分类号 G02B21/06;G01N21/55;G01N21/64;G02B21/00;G02B21/16 主分类号 G02B21/06
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