发明名称 MOS transistor having a recessed gate electrode and fabrication method thereof
摘要 A metal oxide semiconductor (MOS) transistor having a recessed gate electrode and a fabrication method thereof are provided. The MOS transistor includes a semiconductor substrate and an isolation layer formed in a predetermined region of the semiconductor substrate to define an active region. A channel trench region is disposed within the active region to cross the active region. A gate insulating layer is disposed to cover sidewalls and a bottom of the channel trench region. The MOS transistor has a gate pattern that fills the channel trench region and crosses above the active region. A portion of the sidewall of the gate pattern is recessed at an upper corner of the channel trench region and has a width smaller than the width of the top of the gate pattern and smaller than the width of the channel trench region.
申请公布号 US7368769(B2) 申请公布日期 2008.05.06
申请号 US20050184801 申请日期 2005.07.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PAIK JAE-CHOEL
分类号 H01L27/148;H01L21/336;H01L29/768 主分类号 H01L27/148
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