发明名称 |
MOS transistor having a recessed gate electrode and fabrication method thereof |
摘要 |
A metal oxide semiconductor (MOS) transistor having a recessed gate electrode and a fabrication method thereof are provided. The MOS transistor includes a semiconductor substrate and an isolation layer formed in a predetermined region of the semiconductor substrate to define an active region. A channel trench region is disposed within the active region to cross the active region. A gate insulating layer is disposed to cover sidewalls and a bottom of the channel trench region. The MOS transistor has a gate pattern that fills the channel trench region and crosses above the active region. A portion of the sidewall of the gate pattern is recessed at an upper corner of the channel trench region and has a width smaller than the width of the top of the gate pattern and smaller than the width of the channel trench region.
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申请公布号 |
US7368769(B2) |
申请公布日期 |
2008.05.06 |
申请号 |
US20050184801 |
申请日期 |
2005.07.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PAIK JAE-CHOEL |
分类号 |
H01L27/148;H01L21/336;H01L29/768 |
主分类号 |
H01L27/148 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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