发明名称 PLANAR SPLIT-GATE HIGH-PERFORMANCE MOSFET STRUCTURE AND MANUFACTURING METHOD
摘要 This invention discloses an improved semiconductor power device includes a plurality of power transistor cells wherein each cell further includes a planar gate padded by a gate oxide layer disposed on top of a drift layer constituting an upper layer of a semiconductor substrate wherein the planar gate further constituting a split gate including a gap opened in a gate layer whereby the a total surface area of the gate is reduced. The transistor cell further includes a JFET (junction field effect transistor) diffusion region disposed in the drift layer below the gap of the gate layer wherein the JFET diffusion region having a higher dopant concentration than the drift region for reducing a channel resistance of the semiconductor power device. The transistor cell further includes a shallow surface doped regions disposed near a top surface of the drift layer under the gate adjacent to the JFET diffusion region wherein the shallow surface doped region having a dopant concentration lower than the JFET diffusion region and higher than the drift layer.
申请公布号 WO2007143130(A3) 申请公布日期 2008.05.02
申请号 WO2007US13005 申请日期 2007.05.30
申请人 ALPHA & OMEGA SEMICONDUCTOR, LTD. 发明人 BHALLA, ANUP;HEBERT, FRANCOIS;NG, DANIEL, S.
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
主权项
地址