ANALYSIS AND OPTIMIZATION OF MANUFACTURING YIELD IMPROVEMENTS

摘要

Techniques for improving the design of circuits, such as integrated microcircuits. A proposed circuit design is analyzed to identify design features associated with yield loss in manufactured circuits. Corrective design changes that will reduce the yield losses associated with the yield loss features then are designated. Once the corrective design changes have been determined, the corrective design changes that will optimize the manufacturing yield of the circuit are selected and incorporated into the circuit design. This analysis and revision process may then be repeated for each revised circuit design, until no further reduction in the manufacturing can be obtained.