发明名称 ILLUMINATION SYSTEM FOR A MICROLITHOGRAPHY PROJECTION EXPOSURE APPARATUS AND PROJECTION EXPOSURE
摘要 An optical system (250) for altering radiation passing through from an entrance surface (261) to an exit surface (263) of the optical system is assigned a feedback device for feeding back the radiation led through the optical system in a first passage from the exit surface (263) to the entrance surface (261) of the optical system. The feedback device is set up such that the radiation altered by the optical system in a first passage passes through the optical system a second time in the same passage direction. The optical system may be incorporated in an illumination system for a microlithography projection exposure apparatus.
申请公布号 WO2007137763(A3) 申请公布日期 2008.05.02
申请号 WO2007EP04622 申请日期 2007.05.24
申请人 CARL ZEISS SMT AG;KOHL, ALEXANDER 发明人 KOHL, ALEXANDER
分类号 G03F7/20 主分类号 G03F7/20
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