发明名称 |
LITHOGRAPHIC APPARATUS COMPRISING A SUPPORT, AN ARRAY OF INDIVIDUALLY CONTROLLABLE ELEMENTS, AND A PROJECTION SYSTEM |
摘要 |
<p>A lithographic apparatus comprising a support, an array of individually controllable elements, and a projection system are provided to improve a resolution pattern and flexibility. A supporting unit(IL) supports a patterning device modulating a beam of radiation in order to form a first modulation beam of radiation. An array of individually controllable elements(PD) modulates the first modulation beam of radiation to form a second modulation beam of radiation. A projection system(PS) projects the second modulation beam of radiation onto a substrate. A size of a portion of the radiation beam being projected onto the substrate corresponding to a minimum feature size of a pattern provided by the patterning device is smaller than that of a portion of the radiation beam being projected onto the substrate corresponding to the array of individually controllable elements.</p> |
申请公布号 |
KR20080038098(A) |
申请公布日期 |
2008.05.02 |
申请号 |
KR20080023720 |
申请日期 |
2008.03.14 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
TROOST KARS ZEGER;BASELMANS JOHANNES JACOBUS MATHEUS;BLEEKER ARNO JAN;GREENEICH JAMES SHERWOOD |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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