PROCESS FOR MARKING A SEMI-CONDUCTOR PLATE FOR ITS IDENTIFICATION AND THE SEMI-CONDUCTOR PLATE MARKED BY THIS PROCESS

摘要

Process for marking a semi-conductor plate for its identification and semi-conductor plate marked by this process The invention relates to a process for marking a plate (1) in semi-conductor material for its identification. In this process, the focus is on the bundle (3) of a laser (2) in the volume of the plate (1) on points of this volume. Such focusing is realized so as to locally modify, within the area of the points (4, the optical properties of the material of the plate (1). All of the points (4) of the volume of the plate (1) whose optical properties have been modified are positioned within the marking zone (8) and define a code that identifies the plate (1). The objective of the invention is to minimize the pollution during the marking of the plate and that induced later during the fabrication based on this substrate (1).