SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for shortening an inspection time by inputting an expected value of output judgement from the outside without increasing terminals and enhancing facilitating of design and enlargement of a test pattern, and to provide a method of inspecting the semiconductor integrated circuit. SOLUTION: The semiconductor integrated circuit includes: compressing to collect the output of a flip-flop circuit 12 with a final scan function included in each scan chain 111 by an output compression circuit 112; comparing a collected value of the output from each scan chain 111 output from the output compression circuit 112 with the expected value written from the outside on an expected value holding circuit 113 by an expected value judging circuit 114; outputting a judged result of quality due to the comparison to the outside from one output terminal 116 of the expected value judging circuit 114; and holding the judged result regardless of system reset. COPYRIGHT: (C)2008,JPO&INPIT