发明名称 Exposure Apparatus, Supply Method And Recovery Method, Exposure Method, And Device Producing Method
摘要 The present invention provides an exposure apparatus that can prevent the degradation of exposure and measurement accuracies. An exposure apparatus (EX) exposes a substrate (P) by irradiating the substrate (P) with exposure light (EL) through a projection optical system (PL) and a liquid (LQ), and comprises: a liquid supply mechanism ( 10 ) that supplies the liquid (LQ) between an optical element ( 2 ) at the image plane side tip part of the projection optical system (PL) and a substrate (P) that opposes the optical element ( 2 ); a timer ( 60 ) that measures the time that has elapsed since the supply of the liquid by the liquid supply mechanism ( 10 ) was started; and a control apparatus (CONT) that determines, based on a measurement result of the timer ( 60 ), whether a space(SP), which is between the optical element ( 2 ) and the substrate (P) and includes at least an optical path of the exposure light (EL), is filled with the liquid (LQ).
申请公布号 US2008100810(A1) 申请公布日期 2008.05.01
申请号 US20050589437 申请日期 2005.02.17
申请人 SHIRAISHI KENICHI 发明人 SHIRAISHI KENICHI
分类号 G03B27/42;G03B27/52;G03F7/20;H01L21/027 主分类号 G03B27/42
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