发明名称 Method of manufacturing III group nitride semiconductor thin film and method of manufacturing III group nitride semiconductor device using the same
摘要 A method of manufacturing a III group nitride semiconductor thin film and a method of manufacturing a nitride semiconductor light emitting device employing the III group nitride semiconductor thin film manufacturing method, the III group nitride semiconductor thin film manufacturing method including: growing a first nitride single crystal on a substrate for growing a nitride; applying an etching gas to a top surface of the first nitride single crystal to selectively form a plurality of pits in a high dislocation density area; and growing a second nitride single crystal on the first nitride single crystal to maintain the pits to be void.
申请公布号 US2008099781(A1) 申请公布日期 2008.05.01
申请号 US20070898955 申请日期 2007.09.18
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 CHOI RAK JUN;VLADIMIR KURESHOV;OH BANG WON;PARK GIL HAN;PARK HEE SEOK;PARK SEONG EUN;PARK YOUNG MIN;KIM MIN HO
分类号 H01L21/20;H01L33/00 主分类号 H01L21/20
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