发明名称 DRIVING CIRCUIT OF DISPLAY DEVICE AND TEST METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To easily identify a defective portion in an operation test of a driving circuit when the circuit is determined as defective in characteristics. SOLUTION: A first switching circuit 14 disposed between a grayscale voltage selection circuit 12 and an output circuit 7 includes a test switch 14a that separates the grayscale voltage selecting circuit 12 from the output circuit 7 in a test mode, a test switch 14b that connects the grayscale voltage selecting circuit 12 to a tester connecting terminal TESR1 in a test mode, and a test switch 14c that connects the output circuit 7 to a tester connecting terminal TSR2 in a test mode. A second switching circuit 15 disposed between a grayscale voltage generating circuit 11 and the grayscale voltage selecting circuit 12 has a test switch 15a that separates the grayscale voltage generating circuit 11 from the grayscale voltage selecting circuit 12 in a test mode. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008102344(A) 申请公布日期 2008.05.01
申请号 JP20060285281 申请日期 2006.10.19
申请人 NEC ELECTRONICS CORP 发明人 TATSUKE TOSHIICHI
分类号 G09G3/36;G02F1/133;G09G3/20 主分类号 G09G3/36
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