| 摘要 |
PROBLEM TO BE SOLVED: To reduce a chip occupied area by employing a fixed data shift redundancy method and enabling to share a data buffer among defective address latch circuits in a plurality of relief areas. SOLUTION: In a fixed shift redundancy circuit of a semiconductor memory, the address latch circuits CFDLTC<0>-<3> provided corresponding to each of the relief areas <0>-<3> to store the defective column address share a read side switch and a write side switch. COPYRIGHT: (C)2008,JPO&INPIT
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