| 摘要 |
PROBLEM TO BE SOLVED: To more effectively use a current pixel type semiconductor device. SOLUTION: Each of energy signals e<SB>1</SB>outputted from pixel type semiconductor devices 1a of a semiconductor detector 1 is analyzed by a pixel energy spectrum analysis device 3 to obtain each of pixel values, the pixel values are sorted into first to third classes C<SB>1</SB>, C<SB>2</SB>, C<SB>3</SB>, for example, corresponding to degrees of performance of the pixel type semiconductor devices 1a by a shorter 4. Values of an attention pixel of the second class C<SB>2</SB>and a defect pixel of the third class C<SB>3</SB>, for example, sorted as low-performance pixels of the pixel type semiconductor devices 2a are interpolated by an interpolation processing device 6, respectively. COPYRIGHT: (C)2008,JPO&INPIT
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