发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which contact resistance with an anode electrode can be reduced, and to provide a manufacturing method of the semiconductor device. SOLUTION: This semiconductor device is provided with a heterosemiconductor region 3, having a heterojunction with a first main surface of a silicon carbide semiconductor substrate 100 and made of a polycrystalline silicon, having a bandgap different from that of the silicon carbide, a buffer layer 4 made of germanium and having contact with the heterosemiconductor region 3, an anode electrode 5 contacting the buffer layer 4, and a cathode electrode 6 contacting the rear surface of the silicon carbide substrate 1. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008103392(A) 申请公布日期 2008.05.01
申请号 JP20060282508 申请日期 2006.10.17
申请人 NISSAN MOTOR CO LTD 发明人 TANAKA HIDEAKI;HOSHI MASAKATSU;HAYASHI TETSUYA;YAMAGAMI SHIGEHARU
分类号 H01L21/28;H01L21/336;H01L27/04;H01L29/06;H01L29/12;H01L29/78;H01L29/861 主分类号 H01L21/28
代理机构 代理人
主权项
地址