发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To achieve integration of a DRAM and a logic integrated circuit into a single semiconductor integrated circuit device having a system-on-chip structure while maintaining both the performance of the DRAM and that of the logic integrated circuit. SOLUTION: In a semiconductor integrated circuit device having a system-on-chip structure, in which a DRAM and a logic integrated circuit are mounted mixedly, a silicide layer 20 is provided on the surfaces of a source and a drain (13, 14) of MISFETs (Qn<SB>1</SB>, Qp<SB>1</SB>) constituting a direct peripheral circuit of the DRAM, on the surfaces of a source and a drain of MISFETs constituting an indirect peripheral circuit, and on the surfaces of a source and a drain (17, 19) of MISFETs (Qn<SB>2</SB>, Qp<SB>2</SB>) constituting the logic integrated circuit. No silicide layer is provided on the surfaces of a source and a drain (9) of a memory cell selection MISFET (Qs) constituting a memory cell of the DRAM. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008103744(A) 申请公布日期 2008.05.01
申请号 JP20070292938 申请日期 2007.11.12
申请人 RENESAS TECHNOLOGY CORP 发明人 TOKUNAGA TAKAFUMI;YOSHIDA MAKOTO;OTSUKA FUMIO
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
代理机构 代理人
主权项
地址