发明名称 METHOD AND APPARATUS FOR FOCUSING AND DEFLECTING ELECTRON BEAM OF X-RAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for focusing and deflecting an electron beam of an X-ray device. SOLUTION: This apparatus for focusing and deflecting an electron beam 24 of an X-ray device 10 includes a vacuum enclosure 18, and a cathode assembly 14 disposed within the vacuum enclosure 18. The cathode assembly 14 is structured to transmit an electron beam 24 comprising a plurality of electrons 26. The cathode assembly 14 is generally maintained at a first voltage. The apparatus also includes an anode 12 disposed within the vacuum enclosure 18. The anode 12 is generally maintained at a second voltage. The apparatus also includes a member 20 disposed within the vacuum enclosure 18 between the cathode assembly 14 and the anode 12. The member 20 defines an aperture 22 through which the electron beam 24 is passed. The member 20 is generally maintained at the second voltage. A corresponding method for focusing and deflecting the electron beam 24 of the x-ray device 10 is also disclosed. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008103326(A) 申请公布日期 2008.05.01
申请号 JP20070265059 申请日期 2007.10.11
申请人 GENERAL ELECTRIC CO <GE> 发明人 LEMAITRE SERGIO
分类号 H01J35/14;H01J35/06 主分类号 H01J35/14
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