发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a thin film transistor (TFT) which is excellent in flatness of a gate insulating film and its manufacturing method. SOLUTION: The semiconductor device is constructed in a manner such that a channel is located in an insulator layer on a substrate 10, a gate electrode 12 is formed in its channel so that its surface is substantially flush with the surface of the insulator layer, a semiconductor layer 14 is positioned on the gate electrode 12 through a gate insulating film 13, and at least one of a source electrode 15 and drain electrode is electrically connected to the semiconductor layer. The gate insulating film 13 includes an insulator coating film 131 located on the gate electrode 12 and an insulator CVD film 132 formed thereon. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008103653(A) 申请公布日期 2008.05.01
申请号 JP20060313492 申请日期 2006.11.20
申请人 TOHOKU UNIV;NIPPON ZEON CO LTD 发明人 OMI TADAHIRO;SUGITANI KOICHI
分类号 H01L21/336;H01L29/417;H01L29/786 主分类号 H01L21/336
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