| 摘要 |
A measurement device capable of measuring a contact potential difference between a first surface and a second surface separated by an insulator through the application of an external potential. The measurement device comprises a first surface having at least two sectors V1-V4 capable of collecting data independently of one another. The two or more sectors are capable of adopting different potentials with respect to the, or, each other sector. The potential of the two or more sectors are capable of independent modification with respect to the potential of the, or, each other sector. The two or more sectors are each provided with a data acquisition channel coupled to a data processing means. The measurement device may comprise a probe such as a Kelvin probe. |
