发明名称 POWER SUPPLY UNIT FOR MEMORY TEST SYSTEM
摘要 A power supply unit for a memory test system is provided to have various power supply warnings of the memory test system according to the number of abnormal power supply parts, by comprising a number of power supply parts for each test board. A number of power supply parts(20-1-20-m) provide a rating voltage to each test board of a memory test system. A blocking diode(21-1-21-m) is connected to each output stage of the power supply parts. A sensing part(22) senses operation state of the power supply parts, and generates a signal to indicate the sensed operation state of each power supply part. A control part(23) controls power supply state of the memory test system by classifying the power supply state into a normal mode, a warning mode and a blocking mode on the basis of an operation state signal of each power supply part. An output part(24) indicates the power supply state of the memory test system and the operation state of each power supply part.
申请公布号 KR100826293(B1) 申请公布日期 2008.04.30
申请号 KR20060107758 申请日期 2006.11.02
申请人 FROM 30 CO., LTD. 发明人 KIM, GWI HAN
分类号 G11C5/14;G11C7/06;G11C29/00 主分类号 G11C5/14
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