Computer system-assisted electronic data processing device testing method, involves continuously writing data in unused portion of passive storage area, and comparing data with reference data to conclude functional capability of memories

摘要

The method involves continuously writing test data e.g. bit-pattern, in a current unused portion of a passive storage area during operation of a computer system-assisted device (1). The test data are checked and compared with reference data to conclude the functional capability of a RAM memory (5), ROM memory (7) e.g. electrically programmable ROM memory, data memory and a program memory, where the test data vary during the operation. A CPU and the memories are realized in physically separated components.