发明名称 |
METHOD FOR FORMING FILM OF GROUP III NITRIDE SUCH AS GALLIUM NITRIDE |
摘要 |
[PROBLEM TO BE SOLVED] To film deposit a group III nitride such as GaN using atmospheric pressure plasma. [SOLVING MEANS] A reactor chamber 12 is filled with a pure nitrogen of approximately atmospheric pressure of about 40 kPa. A c-face sapphire substrate 90 is placed on an electrode 14. The substrate temperature is brought to 650 degree centigrade by a heater 15. An electric field is applied between electrodes 13, 14 to form a discharge space 11a therebetween. In a gas feed system 20, a small quantity of trimethylgallium is added to N 2 , the resultant is fed into a discharge space 11a and brought into contact with the sapphire substrate 90. A V/III ratio on the substrate 90 is brought into a range of from 10 to 100000.
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申请公布号 |
EP1916704(A1) |
申请公布日期 |
2008.04.30 |
申请号 |
EP20060782264 |
申请日期 |
2006.08.03 |
申请人 |
SEKISUI CHEMICAL CO., LTD. |
发明人 |
NAGATA, TAKAHIRO;CHIKYO, TOYOHIRO;UEHARA, TSUYOSHI |
分类号 |
H01L21/205;C23C16/34;C23C16/509 |
主分类号 |
H01L21/205 |
代理机构 |
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地址 |
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