EASILY TESTABLE SEMICONDUCTOR DEVICE, METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICE, METHOD AND APPARATUS FOR GENERATING INTERNALL TESTING CLOCK

摘要

An easily testable semiconductor device, a method and an apparatus for testing the semiconductor device, and a method and an apparatus for generating a test clock for semiconductor device test are provided to reduce cost of the semiconductor device by testing the semiconductor device using a low cost test equipment. A semiconductor device test system(300) includes a semiconductor device(320) and a tester(310) sending a test signal to the semiconductor device. The tester includes a main circuit part(323), a test circuit part(322) to test the main circuit part, an internal clock generator(324) and a test clock generator(321). The test circuit part includes a test mode register. The test clock generator generates a test clock on the basis of an external clock, an internal clock and a control signal. The internal clock generator generates an internal clock for operation of the main circuit part.