SEMICONDUCTOR DEVICE AND TEST SYSTEM OUTPUTTING FUSE CUT INFORMATION SEQUENTIALLY

摘要

A semiconductor device outputting fuse cutting information sequentially and a test system thereof are provided to output the fuse cutting information sequentially by using a plurality of latches connected serially. According to a semiconductor device(100) including a plurality of fuses, N latches(150_1-150_n) are serially connected and latch corresponding fuse cutting information among fuse cutting information indicating whether the fuses are cut. The fuse cutting information is transferred sequentially through the latches, and then is outputted to the outside. A plurality of multiplexers(MUX2-MUXn) output one of fuse cutting information of a fuse corresponding to the fuse cutting information outputted from a latch in a stage prior to the corresponding latch to the corresponding latch selectively.