STRUCTURE AND APPARATUS FOR MEASURING CHARACTERISTICS OF ELECTRIC CONTACT THIN-FILM AND MANUFACTURING MATHOD THEREOF

摘要

A structure and an apparatus for measuring characteristics of an electric contact thin film, and a method for manufacturing the same are provided to improve reliability of a switch by manufacturing the switch with a selected contact thin film material. A structure for measuring characteristics of an electric contact thin film includes a first substrate(100), a first electric contact thin film(110), a second substrate(200), a protrusion unit(210), and a second electric contact thin film(220). The first electric contact thin film is formed on an upper part of the first substrate. The second substrate is located on a floating region from an upper part of the first electric contact thin film. The protrusion unit is formed on a lower part of the second substrate opposite to the first substrate. The second electric contact thin film wraps the protrusion unit and is formed on a lower part of the second substrate.