发明名称 METHOD OF MANUFACTURING FLASH MEMORY DEVICE
摘要 <p>A method for manufacturing a flash memory device is provided to enhance performance of the flash memory device by reducing a contact area between a floating gate and a tunnel oxide layer and improving a contact area between the floating gate and an ONO layer. An isolation pattern(2) is formed on an active region of a semiconductor substrate(1). A tunnel oxide layer pattern is formed selectively on the active region. A polysilicon pattern(5) having a sidewall and an upper surface connected to the sidewall is formed on a tunnel oxide layer(3). A metastable polysilicon growth layer(6) having an embossing shape is formed on a surface of the polysilicon pattern to increase the surface area of the polysilicon pattern. An ONO layer(8) is formed to cover the metastable polysilicon growth layer. A control gate(9) is formed on the ONO layer. The metastable polysilicon growth layer is formed on the sidewall and the upper surface.</p>
申请公布号 KR100824921(B1) 申请公布日期 2008.04.23
申请号 KR20060118811 申请日期 2006.11.29
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 JEONG, TAE WOONG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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