发明名称 |
METHOD OF MANUFACTURING FLASH MEMORY DEVICE |
摘要 |
<p>A method for manufacturing a flash memory device is provided to enhance performance of the flash memory device by reducing a contact area between a floating gate and a tunnel oxide layer and improving a contact area between the floating gate and an ONO layer. An isolation pattern(2) is formed on an active region of a semiconductor substrate(1). A tunnel oxide layer pattern is formed selectively on the active region. A polysilicon pattern(5) having a sidewall and an upper surface connected to the sidewall is formed on a tunnel oxide layer(3). A metastable polysilicon growth layer(6) having an embossing shape is formed on a surface of the polysilicon pattern to increase the surface area of the polysilicon pattern. An ONO layer(8) is formed to cover the metastable polysilicon growth layer. A control gate(9) is formed on the ONO layer. The metastable polysilicon growth layer is formed on the sidewall and the upper surface.</p> |
申请公布号 |
KR100824921(B1) |
申请公布日期 |
2008.04.23 |
申请号 |
KR20060118811 |
申请日期 |
2006.11.29 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
JEONG, TAE WOONG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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