发明名称 Process for forming a feature by undercutting a printed mask
摘要 <p>A print patterned mask is formed a digital lithographic process on the surface of a photoresist or similar material layer. The print patterned mask is then used as a development or etching mask, and the underlying layer overdeveloped or overetched to undercut the print patterned mask. The mask may be removed and the underlying structure used an etch mask or as a final structure. Fine feature widths, narrower the minimum width of the print patterned mask features, may be obtained while realizing the benefits of digital lithography in the manufacturing process. </p>
申请公布号 EP1906229(A3) 申请公布日期 2008.04.23
申请号 EP20070100906 申请日期 2007.01.22
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 LIMB, SCOTT J.;WONG, WILLIAM S.;READY, STEVEN E.;CHABINYC, MICHAEL L.
分类号 G03F1/00;G02F1/1335 主分类号 G03F1/00
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