发明名称 Test data processing apparatus and test data processing method
摘要 The test data processing apparatus (1) of the present invention is a test data processing apparatus (1) for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section (6), wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section (6).
申请公布号 EP1914539(A2) 申请公布日期 2008.04.23
申请号 EP20070117705 申请日期 2007.10.02
申请人 NITTO DENKO CORPORATION 发明人 OHASHI, HIROMICHI
分类号 G01N21/89;G01N21/95 主分类号 G01N21/89
代理机构 代理人
主权项
地址