| 摘要 |
A probe is provided to facilitate maintenance by contacting terminals of first and second line groups with each other without soldering. A probe includes a horizontal spring(11) and a fixed slice terminal(13). A ztheta deformation unit(15) with a rotation center(14) is series-connected with a vertical probe unit(12). An end portion of the ztheta deformation unit makes contact with the surface of a pad(16). The pad is moved in a vertical direction with respect to an end portion of the vertical probe unit, while a horizontal girder of the probe is maintained at horizontal posture. When the pad is contacted with the end portion of the vertical probe unit and an overdrive force is applied to push the pad upwards, two horizontal girders(11a,11b) are rotated in parallel to each other and the vertical probe unit is moved in the vertical direction. The ztheta deformation unit is moved in horizontal and vertical directions according to the movement of the vertical probe unit. A clockwise rotation around the rotation center is initiated when the overdrive force is applied. |
