发明名称 ESD protection circuit for a mixed-voltage semiconductor device
摘要 An ESD protection circuit is implemented for a semiconductor device having a first circuit system operating with a first power supply voltage and a first complementary power supply voltage, and a second circuit system operating with a second power supply voltage and a second complementary power supply voltage. The ESD protection circuit includes a first diode having an anode coupled to the first power supply voltage and a cathode coupled to a first node connecting the first circuit system and the second circuit system for preventing a crosstalk of current between the first power supply voltage and the second complementary power supply voltage. A first MOS transistor module is coupled between the first node and the first complementary power supply for selectively creating a current path from the first node to the first complementary supply voltage for dissipating an ESD current during an ESD event.
申请公布号 US7362555(B2) 申请公布日期 2008.04.22
申请号 US20060509998 申请日期 2006.08.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU CHAU-NENG;LEE JIAN-HSING
分类号 H02H9/00 主分类号 H02H9/00
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