发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device of a dual-gate structure including a P-channel type field-effect transistor formed at a first region of a substrate and an N-channel type field-effect transistor formed at a second region of the substrate, includes a gate electrode including a polycrystalline silicon film continuously formed on the substrate to cover the first and second regions and a metal silicide film formed on the polycrystalline silicon film. The polycrystalline silicon film has a P-type part located on the first region and an N-type part coming into contact with the P-type part and located on the second region, and the P-type part is further doped with a heavier element than a P-type impurity that determines a conductivity type of the P-type part.
申请公布号 US7361932(B2) 申请公布日期 2008.04.22
申请号 US20060474391 申请日期 2006.06.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TSUZUMITANI AKIHIKO
分类号 H01L29/10;H01L29/76;H01L31/036;H01L31/112 主分类号 H01L29/10
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