发明名称 MEASURING SYSTEM
摘要 A measurement system is provided to obtain highly reliable result by transmitting standardized and quantified pattern to a display device and analyzing data with a standardized analysis program. A measurement system comprises an interface(110), a user input part(130), and a controller(120). The interface communicates with a pattern generator(210) and a measurement part(220). The pattern generator generates a predetermined pattern for measuring a plurality of measurement points and outputs the pattern to the display device(300) by control of the controller. The measurement part measures the measurement points according to the pattern inputted from the pattern generator. The controller includes a measurement control part and an analysis program. The measurement control part controls pattern generator and the measurement part for generating the pattern and measuring the measurement points when the measurement points are selected by a user through the interface. The analysis program analyzes measured data, processes graphs, and gets a result.
申请公布号 KR100823291(B1) 申请公布日期 2008.04.21
申请号 KR20070030834 申请日期 2007.03.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEO, SUNG WON;CHOI, JAE YOUNG
分类号 G01J3/46;G01J1/44 主分类号 G01J3/46
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