发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a through electrode and its manufacturing method without changing a standard manufacturing condition for the semiconductor device. SOLUTION: The through electrode is formed at first. After that the semiconductor device is formed by the standard manufacturing method. The side of the through electrode is insulated from a semiconductor substrate by an insulation film, and the surface is coated with a protection insulation film. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008085173(A) 申请公布日期 2008.04.10
申请号 JP20060265270 申请日期 2006.09.28
申请人 ELPIDA MEMORY INC 发明人 UCHIYAMA SHIRO
分类号 H01L21/3205;H01L23/52 主分类号 H01L21/3205
代理机构 代理人
主权项
地址