| 摘要 |
PROBLEM TO BE SOLVED: To provide a temperature information output device (On Die Thermal Sensor: ODTS) for updating accurate temperature information, regardless of the operating mode of a DRAM in a semiconductor element. SOLUTION: The temperature information output device includes a temperature information code generating means for measuring the internal temperature of a semiconductor element, in response to a first enable signal and a second enable signal, and for generating a temperature information code having information on the temperature thus measured; and a flag signal logic decision means for generating, in response to the first enable signal and the second enable signal, a plurality of first flag signals having temperature information, and for selecting whether each of the first flag signal has a set logic level value or a fluctuating logic level value. COPYRIGHT: (C)2008,JPO&INPIT |
