发明名称 |
FORMING METHOD OF CARBON NANOTUBE INTERCONNECTION, AND FORMING METHOD OF SEMICONDUCTOR ELEMENT INTERCONNECTION USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a carbon nanotube interconnection which does not cause interface breakdown phenomenon, and a method for forming a semiconductor element interconnection using thereof. SOLUTION: This method of forming a carbon nanotube interconnection comprises the steps of: forming an oxide metal film on a substrate; forming an insulating film pattern having an opening that exposes the surface of the oxide metal film; forming a catalyst metal film pattern for carbon nanotube growth from the oxide metal film that is exposed in the opening; and forming a carbon nanotube interconnection by growing the carbon nanotubes from the catalyst metal film pattern. The method of forming a carbon nanotube interconnection can prevent the phenomenon of growing the carbon nanotubes between the insulating film pattern and the catalyst metal film pattern. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008085336(A) |
申请公布日期 |
2008.04.10 |
申请号 |
JP20070247337 |
申请日期 |
2007.09.25 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LEE SUN-WOO;YEO IN SEOK;LEE JUN YOUNG;KIM JUNG HYEON;YOON HONG SIK;BYUN KYUNG-RAE |
分类号 |
H01L21/3205;C23C14/08;C23C14/14;C23C14/16;C23C16/06;C23C16/40;H01L21/28;H01L21/285;H01L21/768;H01L23/52;H01L27/105 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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