发明名称 FORMING METHOD OF CARBON NANOTUBE INTERCONNECTION, AND FORMING METHOD OF SEMICONDUCTOR ELEMENT INTERCONNECTION USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a carbon nanotube interconnection which does not cause interface breakdown phenomenon, and a method for forming a semiconductor element interconnection using thereof. SOLUTION: This method of forming a carbon nanotube interconnection comprises the steps of: forming an oxide metal film on a substrate; forming an insulating film pattern having an opening that exposes the surface of the oxide metal film; forming a catalyst metal film pattern for carbon nanotube growth from the oxide metal film that is exposed in the opening; and forming a carbon nanotube interconnection by growing the carbon nanotubes from the catalyst metal film pattern. The method of forming a carbon nanotube interconnection can prevent the phenomenon of growing the carbon nanotubes between the insulating film pattern and the catalyst metal film pattern. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008085336(A) 申请公布日期 2008.04.10
申请号 JP20070247337 申请日期 2007.09.25
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE SUN-WOO;YEO IN SEOK;LEE JUN YOUNG;KIM JUNG HYEON;YOON HONG SIK;BYUN KYUNG-RAE
分类号 H01L21/3205;C23C14/08;C23C14/14;C23C14/16;C23C16/06;C23C16/40;H01L21/28;H01L21/285;H01L21/768;H01L23/52;H01L27/105 主分类号 H01L21/3205
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