发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a substrate processing apparatus, a substrate processing method, and a method of manufacturing a semiconductor device whereby a natural oxide film or contaminants such as an organic matter can be removed at low temperatures to solve the problem of a method of removing the natural oxide film at high temperatures. <P>SOLUTION: The method of manufacturing the semiconductor device includes the steps of: carrying a substrate into a processing chamber, the substrate having a partially exposed silicon surface; heating the inside of the processing chamber; performing pretreatment of supplying at least silane gas, halogen gas, and hydrogen gas into the processing chamber, removing a natural oxide film or contaminants at least on the silicon surface, and growing an epitaxial film on the silicon surface; and supplying gas containing at least silicon into the processing chamber after the pretreatment process to grow another epitaxial film on the epitaxial film. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008085198(A) 申请公布日期 2008.04.10
申请号 JP20060265510 申请日期 2006.09.28
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 O KETSU;OGAWA YASUHIRO;YAMAMOTO KATSUHIKO;YOKOGAWA TAKASHI
分类号 H01L21/205 主分类号 H01L21/205
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