发明名称 OPTICAL INSPECTION SYSTEM AND OPTICAL INSPECTION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce erroneous detection of a defect when inspecting a printed circuit board. <P>SOLUTION: The optical inspection system for an electric circuit device is provided with: an optical inspection means for providing an optical inspection output for at least one area on the electric circuit device of an object to be inspected; an algorithm inspection means for providing an algorithm inspection output for the at least one area; a display for displaying the at least one area visibly recognizably to an operator, based on the optical inspection output; and a display controller for providing an index indicating inconsistency between detected reaction of the operator and the algorithm inspection output. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008083044(A) 申请公布日期 2008.04.10
申请号 JP20070231102 申请日期 2007.09.06
申请人 ORBOTECH LTD 发明人 SILVERMAN REUVEN;NEDIVI JACOB;MITLANSKI LEONID;TURKENICH ERAN
分类号 G01N21/956;H05K3/00 主分类号 G01N21/956
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