| 摘要 |
PROBLEM TO BE SOLVED: To provide a highly accurate defect relief determination device preventing a large increase of processing time, and a defect relief determination method. SOLUTION: The defect relief determination device searches the relief pattern using a memory chip in combination of the conventional algorithm and a genetic algorithm based on the defective bit position information of the memory chip having a plurality of redundancy circuits substitutable with the row or column of the memory circuit. A search means has a first chromosome having genes corresponding in number to the number of the redundancy circuits of the row and a second chromosome having genes corresponding in number to the number of the redundancy circuits of the column as a chromosome of each solid in the genetic algorithm. The genes of the first chromosome stores the defective row number of the memory chip and the second chromosome stores the defective column number of the memory chip. The number of the relievable chips increases than before, and the yield improves. The increase in the processing time relating to the relief processing is small as a whole. COPYRIGHT: (C)2008,JPO&INPIT
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