| 摘要 |
The analyzer according to the present invention is an analyzer having a scan test function, and including scan paths each having flip-flops which function as a shift register when a scan test is performed, and a switching unit operable to switch between a first connection state, and a second connection state where the scan paths are connected in series to each other and further an output from the last stage of the scan path is connected to the input of the first stage of the scan path.
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