发明名称 CHARACTERIZATION OF MATCHING NETWORK USING VARIABLE IMPEDANCE ANALYSIS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of calculating equivalent series resistance of a matching network using variable impedance analysis and an embodiment of the matching network analyzed using the same. <P>SOLUTION: In one embodiment, a method of calculating the equivalent series resistances of a matching network includes connecting the matching network to a load, measuring an output of the matching network over a range of load impedances, and calculating the equivalent series resistances of the matching network based upon a relationship between the measured output and the load resistance. The load may be a surrogate load or may be a plasma formed in a process chamber. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008084865(A) 申请公布日期 2008.04.10
申请号 JP20070250553 申请日期 2007.09.27
申请人 APPLIED MATERIALS INC 发明人 SHANNON STEVEN C;HOFFMAN DANIEL J;LANE STEVEN;MERRY WALTER R;DINEV JIVKO
分类号 H05H1/46;G01R27/02;H05H1/00 主分类号 H05H1/46
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