发明名称 |
ION TRAP TIME-OF-FLIGHT MASS SPECTROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide an ion trap time-of-flight mass spectroscope of high sensitivity. SOLUTION: Ions fly in a time-of-flight mass spectrometry section 9 (time-of-flight mass spectrometry means) and are transported to an MCP (detector) 8 efficiently by varying the period of high-voltage pulses applied to a PUSH electrode 6 according to the distribution of the number of ions at a multi-pole section 5. Ions are transported to the MCP (detector) 8 efficiently, thus achieving the ion trap time-of-flight mass spectroscope for obtaining high-sensitivity mass spectra. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008084850(A) |
申请公布日期 |
2008.04.10 |
申请号 |
JP20070221374 |
申请日期 |
2007.08.28 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
NAKAMURA HIROSHI;SHISHIKA TSUKASA;TERUI YASUSHI;SAEKI TAKUYA |
分类号 |
H01J49/40;G01N27/62;H01J49/24;H01J49/42 |
主分类号 |
H01J49/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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