发明名称 METHOD OF EVALUATING SURFACE ROUGHNESS AND ITS EVALUATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of evaluating surface roughness and its evaluation device capable of performing in-process evaluation of surface roughness having surface roughness of the order of a fewμm to a few hundreds ofμm by using ultrasonic scattering. SOLUTION: The method of evaluating surface roughness comprises: transmitting a pulsed ultrasound 12 to a surface 10 of an evaluation object; detecting a coherent component of a pulsed ultrasound 15 reflected on the surface 10; and determining roughness height of the surface 10 of the evaluation object by an optimization technique from a value normalized by dividing the strength of the coherent component by the strength of a coherent component in the specular reflection and a frequency f of the pulsed ultrasound. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008082856(A) 申请公布日期 2008.04.10
申请号 JP20060262605 申请日期 2006.09.27
申请人 NAGAOKA UNIV OF TECHNOLOGY 发明人 IHARA IKUO;DEDEN DIAN SUKMANA
分类号 G01B17/08 主分类号 G01B17/08
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