发明名称 |
METHOD OF EVALUATING SURFACE ROUGHNESS AND ITS EVALUATION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of evaluating surface roughness and its evaluation device capable of performing in-process evaluation of surface roughness having surface roughness of the order of a fewμm to a few hundreds ofμm by using ultrasonic scattering. SOLUTION: The method of evaluating surface roughness comprises: transmitting a pulsed ultrasound 12 to a surface 10 of an evaluation object; detecting a coherent component of a pulsed ultrasound 15 reflected on the surface 10; and determining roughness height of the surface 10 of the evaluation object by an optimization technique from a value normalized by dividing the strength of the coherent component by the strength of a coherent component in the specular reflection and a frequency f of the pulsed ultrasound. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008082856(A) |
申请公布日期 |
2008.04.10 |
申请号 |
JP20060262605 |
申请日期 |
2006.09.27 |
申请人 |
NAGAOKA UNIV OF TECHNOLOGY |
发明人 |
IHARA IKUO;DEDEN DIAN SUKMANA |
分类号 |
G01B17/08 |
主分类号 |
G01B17/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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