| 摘要 |
The invention provides a mass spectrometry system, including an ion source for ionizing a sample. The ion source includes a surface for holding and ionizing the sample, an ion collection device adjacent to the surface for receiving ions that are ionized from the surface, a voltage source in electrical connection with the surface and the ion collection device for defining a field ionization field between the surface and the ion collection device, and a light source adjacent to the surface for producing a light source for irradiating and ionizing the sample on the surface, wherein the voltage source produces a field ionization field for ionizing the sample and the light source produces a light for irradiating and ionizing the sample and the same sample on the surface is ionized; and a detector downstream from the ion source for detecting the ions. The invention also provides an ion source for ionizing a sample. The ion source includes a surface for holding and ionizing a sample, an ion collection device adjacent to the surface for receiving ions that are ionized from the surface, a voltage source in electrical connection with the surface and the ion collection device for defining a field ionization field between the surface and the collection device, and a light source adjacent to the surface for producing a light for irradiating and ionizing the sample on the surface, wherein the voltage source produces a field ionization field for ionizing the sample and the laser produces a light source for irradiating and ionizing the sample and the sample on the surface is ionized. The invention also provides a method for ionizing a sample. The method includes the steps of applying a field ionization field to the sample and irradiating the sample with a light source to ionize the sample.
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