发明名称 TUNNEL FIELD EFFECT TRANSISTOR
摘要 <p>A tunnel transistor includes source diffusion (4) of opposite conductivity type to a drain diffusion (6) so that a depletion layer is formed between source and drain diffusions in a lower doped region (8). An insulated gate (16) controls the position and thickness of the depletion layer. The device includes a quantum well formed in accumulation layer (20) which is made of a different material to the lower layer (2) and cap layer (22).</p>
申请公布号 WO2008041188(A1) 申请公布日期 2008.04.10
申请号 WO2007IB54020 申请日期 2007.10.03
申请人 NXP B.V.;CURATOLA, GILBERTO;AGARWAL, PRABHAT;SLOTBOOM, JAN, W.;HURKX, GODEFRIDUS, A., M.;SURDEANU, RADU;DOORNBOS, GERBEN 发明人 CURATOLA, GILBERTO;AGARWAL, PRABHAT;SLOTBOOM, JAN, W.;HURKX, GODEFRIDUS, A., M.;SURDEANU, RADU;DOORNBOS, GERBEN
分类号 H01L29/739;H01L29/165;H01L29/201 主分类号 H01L29/739
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